发明名称 Method for conducting a functional test of a position measuring device and a position measuring device for carrying out this method
摘要 <p>A control value having defined mathematical interrelationship with position value generated by position measuring unit, is generated. The control and associated position values are transmitted to evaluation unit which checks to determine whether there is an interrelationship between control and position values. A correction value is stored in two different memory addresses. An interrelationship between the values is formed by accessing correction value in one address and evaluation unit accesses correction value in another address during checking. An independent claim is also included for position measuring system.</p>
申请公布号 EP1677082(A2) 申请公布日期 2006.07.05
申请号 EP20050020655 申请日期 2005.09.22
申请人 DR. JOHANNES HEIDENHAIN GMBH 发明人 STRASSER, ERICH
分类号 G01D18/00 主分类号 G01D18/00
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