发明名称 Semiconductor devices and methods for depositing a dielectric film
摘要 Embodiments provide methods and apparatuses for chemical vapor depositing a dielectric film, and various structures, devices, and systems, which incorporate dielectric elements formed from the dielectric film. The method includes heating a chamber, within which a substrate is located, to a temperature sufficient to thermally decompose an oxidizing component. A gas flow is passed over the substrate to deposit the dielectric film. To form an oxide, the gas flow includes a silicon bearing component, the oxidizing component, and a chloride component. The silicon bearing component and the chloride component are distinct from each other. To form an oxynitride, the gas flow further includes an ammonia component. The silicon bearing component can be substituted by a tantalum bearing component or an aluminum bearing component, to form other types of oxynitrides.
申请公布号 US7071117(B2) 申请公布日期 2006.07.04
申请号 US20040788892 申请日期 2004.02.27
申请人 MICRON TECHNOLOGY, INC. 发明人 POWELL DON C.
分类号 H01L21/31;C23C16/30;C23C16/40;H01L21/314;H01L21/316;H01L21/469;H01L21/8242 主分类号 H01L21/31
代理机构 代理人
主权项
地址