发明名称 |
System for performing fast testing during flash reference cell setting |
摘要 |
An embedded circuit in a memory device is used in place of an external test device to perform time-consuming tasks such as voltage verification during the setting of reference cells. An external test device programs at least one reference cell to a predetermined value. The embedded circuit uses the cell programmed by the external device as a comparative reference to program additional reference cells.
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申请公布号 |
US2006140030(A1) |
申请公布日期 |
2006.06.29 |
申请号 |
US20050089268 |
申请日期 |
2005.03.24 |
申请人 |
BEDARIDA LORENZO;BARTOLI SIMONE;SURICO STEFANO;FRULIO MASSIMILIANO |
发明人 |
BEDARIDA LORENZO;BARTOLI SIMONE;SURICO STEFANO;FRULIO MASSIMILIANO |
分类号 |
G11C29/00 |
主分类号 |
G11C29/00 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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