发明名称 Tri-axial bending load testing jig
摘要 A tri-axial bending load testing jig includes a die including first and second supporting axes which upholds opposite sides of a board material, the first and the second supporting axes movable so that an interval therebetween can be adjusted according to a size of the board material, a punch mounted at an upper part of the die movable in a vertical direction to press down a center portion of the board material, a punch setting unit formed in the center of the die to set the center and parallelism of the punch with respect to the first and the second supporting axes and having a punch groove for receiving the punch at the center portion of the die, and a material positioning unit guiding a position of the board material to be put on the first and the second supporting axes, according to the size of the board material.
申请公布号 US2006137465(A1) 申请公布日期 2006.06.29
申请号 US20050245067 申请日期 2005.10.07
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 LEE DONG-WOO;YIM SIN-TAEK;BOOH SEONG-WOON;CHO JIN-WOO;KIM KI-TAEK;KWAK DONG-OK
分类号 G01N3/00 主分类号 G01N3/00
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