发明名称 |
Method of forming electrical connections in a semiconductor structure |
摘要 |
A method of forming a semiconductor structure comprises providing a substrate comprising a layer of a material formed on a first surface of the substrate. At least one recess is formed in the layer of material. The formation of the at least one recess comprises performing a dry etching process. A contamination layer formed in the dry etching process is removed from a second surface of the substrate. Thus, contaminations of tools used in later stages of the manufacturing process resulting from flakes splitting off the contamination layer may be avoided.
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申请公布号 |
US2006141775(A1) |
申请公布日期 |
2006.06.29 |
申请号 |
US20050196883 |
申请日期 |
2005.08.04 |
申请人 |
SCHUEHRER HOLGER;SCHALLER MATTHIAS;BARTSCH CHRISTIN |
发明人 |
SCHUEHRER HOLGER;SCHALLER MATTHIAS;BARTSCH CHRISTIN |
分类号 |
H01L21/4763;H01L21/302 |
主分类号 |
H01L21/4763 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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