发明名称 Method of forming a programmable memory cell and chalcogenide structure
摘要 A first conductive electrode material is formed on a substrate. Chalcogenide comprising material is formed thereover. The chalcogenide material comprises A<SUB>x</SUB>Se<SUB>y</SUB>. A silver comprising layer is formed over the chalcogenide material. The silver is irradiated effective to break a chalcogenide bond of the chalcogenide material at an interface of the silver comprising layer and chalcogenide material and diffuse at least some of the silver into the chalcogenide material. After the irradiating, the chalcogenide material outer surface is exposed to an iodine comprising fluid effective to reduce roughness of the chalcogenide material outer surface from what it was prior to the exposing. After the exposing, a second conductive electrode material is deposited over the chalcogenide material, and which is continuous and completely covering at least over the chalcogenide material, and the second conductive electrode material is formed into an electrode of the device.
申请公布号 US7067348(B2) 申请公布日期 2006.06.27
申请号 US20040825319 申请日期 2004.04.16
申请人 MICRON TECHNOLOGY, INC. 发明人 CAMPBELL KRISTY A.;MOORE JOHN T.
分类号 H01L21/00;H01L21/28;H01L27/105;H01L45/00 主分类号 H01L21/00
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