发明名称 CD metrology method
摘要 A method for rapidly analyzing data gathered during scatterometry and related methods uses a combination of database lookup, database interpolation and theoretical model evaluation. Database lookup is used to provide an initial mapping between a measured optical response and a set of associated measurement parameters. Interpolation is then used to refine the optical response and parameters. A theoretical model is then repeatedly evaluated to refine the optical response and parameters previously refined by the interpolation. In this way, the present invention avoids the inaccuracies associated with traditional interpolation-based analysis and without incurring the computational complexity associated with real-time database supplementation.
申请公布号 US7069153(B2) 申请公布日期 2006.06.27
申请号 US20040764792 申请日期 2004.01.26
申请人 THERMA-WAVE, INC. 发明人 JOHNSON KENNETH C.
分类号 G01N21/00;G01N21/88;G01N21/956;G06F11/30 主分类号 G01N21/00
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