发明名称 LITHOGRAPHIC APPARATUS AND DEVICE MANUFACTURING METHOD
摘要 <P>PROBLEM TO BE SOLVED: To provide a lithographic apparatus and a device manufacturing method. <P>SOLUTION: The lithographic apparatus for making a visibility of artifact in a pattern small is provided. The lithographic apparatus comprises a lighting system, a pattern forming apparatus, a projecting system, and a modulating apparatus. A beam of radiation is supplied by the lighting system, and the beam is processed in pattern forming by the pattern forming apparatus. The beam is projected to a target portion by the projecting system. A pattern preparing a modulating scheme is given in such a way that the beam is modulated by the modulating apparatus. <P>COPYRIGHT: (C)2006,JPO&NCIPI
申请公布号 JP2006165548(A) 申请公布日期 2006.06.22
申请号 JP20050347522 申请日期 2005.12.01
申请人 ASML NETHERLANDS BV 发明人 MUNNIG SCHMIDT ROBERT-HAN;JOERI LOF
分类号 H01L21/027;G03F7/20 主分类号 H01L21/027
代理机构 代理人
主权项
地址
您可能感兴趣的专利