| 摘要 |
PROBLEM TO BE SOLVED: To obtain a scan chain forming method for shortening the length of scan chains and making the length of divided scan chains substantially equal at the same time because a method is effective which divides a scan chain into a plurality of scan chains and simultaneously performs a test in parallel in order to shorten a time required for a scan test. SOLUTION: First, a test synthetic tool is used to form one scan chain, and next, an arrangement tool is used to rearrange a flip-flop circuit constituting the scan chain to form a line file of shortened flip-flop chains. In the line file, divided line files are created so as to make the number of flip-flops substantially equal. The line files are used to form a plurality of divided scan chains. An input/output terminal of each scan chain is connected to a scan control circuit, and when an integrated circuit is tested, input/output terminals of a plurality of grouped scan chains are connected to a prescribed pad and a scan test is performed in parallel. COPYRIGHT: (C)2006,JPO&NCIPI
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