发明名称 SEMICONDUCTOR DEVICE, METHOD OF MANUFACTURING THE SAME, AND SEMICONDUCTOR MEMORY DEVICE
摘要 <P>PROBLEM TO BE SOLVED: To make a threshold voltage variable without being accompanied by a leakage current flowing from a gate to a source, and to restrain an increase in element area. <P>SOLUTION: An insulating layer 102 is formed on a semiconductor substrate 101, a semiconductor layer 103 is formed on the insulating layer 102, an insulating layer 104 is formed on the semiconductor layer 103, and a semiconductor layer 105 is formed on the insulating layer 104. A gate electrode 107 is formed on the semiconductor layer 105 through the intermediary of a gate insulating film 106; a source layer 109 and a drain layer 110 are formed on the sides of the gate electrode 107, respectively; and the gate electrode 107 is connected to the semiconductor layer 103 through a wiring layer. <P>COPYRIGHT: (C)2006,JPO&NCIPI
申请公布号 JP2006165251(A) 申请公布日期 2006.06.22
申请号 JP20040354108 申请日期 2004.12.07
申请人 SEIKO EPSON CORP 发明人 KATO TATSU
分类号 H01L29/786;H01L21/76;H01L21/762;H01L21/8238;H01L21/8244;H01L27/08;H01L27/092;H01L27/11;H01L27/12 主分类号 H01L29/786
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