| 摘要 |
PROBLEM TO BE SOLVED: To positionally resolve surface characteristics different according to a position, for example, the distribution, arrangement and directionality of effect pigments or flakes or various optical impressions produced, for example in a case that a surface is observed at different solid angles or by different illuminations at the time of inspection of the surface characteristics to evaluate it. SOLUTION: In a method for positionally resolving the surface characteristics, especially the surface characteristics exerting an effect on the optical characteristics of a surface to inspect and evaluate it and an apparatus therefor, the surface to be inspected is irradiated with a given beam at a first given solid angle. Further, at least a part of the beam especially affected by the scattering or reflection from the surface to be inspected is detected at a second solid angle. At this time, at least one measured value is positionally resolved to be captured to characterize at least one given characteristic of the beam affected by the surface to be inspected. At least one statistic for characterizing the surface is determined through at least a part of the positionally resolved measured value. COPYRIGHT: (C)2006,JPO&NCIPI
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