METHOD AND SYSTEM FOR SELECTIVELY MASKING TEST RESPONSES
摘要
An apparatus for testing an integrated circuit is disclosed. The apparatus includes a compactor to compress test responses from a circuit under test that is part of an integrated circuit.
申请公布号
EP1671141(A1)
申请公布日期
2006.06.21
申请号
EP20040770037
申请日期
2004.09.20
申请人
KONINKLIJKE PHILIPS ELECTRONICS N.V.
发明人
VRANKEN, HENDRIKUS, P., E.;GLOWATZ, ANDREAS;HAPKE, FRIEDRICH
