发明名称 METHOD AND APPARATUS FOR A DUAL SUBSTRATE PACKAGE
摘要 A semiconductor die having a through via formed therein is disclosed. A first conductive layer is formed on the front side of the die and a second conductive layer is formed on the backside of the die, and coupled with the through via. A first package substrate is electrically coupled with the first conductive layer, and a second package substrate is electrically coupled with the second conductive layer. In another embodiment, a substrate ball electrically couples the first and second package substrates. In a further embodiment, a flip chip bump is attached to the first package substrate.
申请公布号 KR20060069502(A) 申请公布日期 2006.06.21
申请号 KR20067006139 申请日期 2006.03.29
申请人 INTEL CORP. 发明人 RUMER CHRISTOPHER;SINGH KULJEET
分类号 H01L23/12;H01L21/60;H01L21/768;H01L23/055;H01L23/48;H01L23/498 主分类号 H01L23/12
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