发明名称 Shallow trench power MOSFET and IGBT
摘要 A power semiconductor device includes a substrate having an upper surface and a lower surface. The substrate has a trench. First and second doped regions are provided proximate the upper surface of the substrate. A first source region is provided within the first doped region. A second source region is provided within the second doped region. A gate is provided between the first and second source regions. The gate includes a first portion extending downward into the trench. A depth of the trench is no more than a depth of the first doped region.
申请公布号 US7063975(B2) 申请公布日期 2006.06.20
申请号 US20030678479 申请日期 2003.10.03
申请人 IXYS CORPORATION 发明人 TSUKANOV VLADIMIR;ZOMMER NATHAN
分类号 H01L21/336;H01L21/331;H01L29/06;H01L29/10;H01L29/423;H01L29/739;H01L29/78 主分类号 H01L21/336
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