发明名称 VARIABLE POROSITY POROUS SILICON ISOLATION
摘要 Varying the porosity through the thickness of a porous silicon layer allows conflicting needs to be met by the same layer: a low porosity surface layer allows a high-quality epitaxial layer of silicon to be grown, or can provide structural support, while greater porosity in other portions of the layer increases circuit isolation and provides stress relief between layers.
申请公布号 KR100591222(B1) 申请公布日期 2006.06.19
申请号 KR19990030731 申请日期 1999.07.28
申请人 发明人
分类号 H01L21/76;C25D11/32;H01L21/02;H01L21/20;H01L21/3063;H01L21/31;H01L21/316;H01L21/762;H01L21/84;H01L27/12;H01L29/16;H01L29/32 主分类号 H01L21/76
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