发明名称 SILICON CARBIDE MOS FIELD-EFFECT TRANSISTOR AND ITS MANUFACTURING METHOD
摘要 PROBLEM TO BE SOLVED: To provide the structure wherein a high proof-pressure SiC vertical MOSFET having the channel region formed by a low concentration p-type deposited layer can be manufactured with the sufficient yield, and to provide a manufacturing method. SOLUTION: Between a low concentration p-type deposited film and a high concentration gate layer, a low concentration n-type deposited film is made to be interposed. Further, the base region led back to n-type by ion implantation is selectively formed in a low concentration p-type deposited film, so that the thickness of a deposited film between the high concentration gate layer and the channel region and gate oxide film is enlarged. COPYRIGHT: (C)2006,JPO&NCIPI
申请公布号 JP2006147789(A) 申请公布日期 2006.06.08
申请号 JP20040334920 申请日期 2004.11.18
申请人 NATIONAL INSTITUTE OF ADVANCED INDUSTRIAL & TECHNOLOGY 发明人 YAO TSUTOMU;HARADA SHINSUKE;OKAMOTO MITSUHISA;FUKUDA KENJI
分类号 H01L29/78;H01L21/336;H01L29/06;H01L29/12 主分类号 H01L29/78
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