发明名称 |
SILICON CARBIDE MOS FIELD-EFFECT TRANSISTOR AND ITS MANUFACTURING METHOD |
摘要 |
PROBLEM TO BE SOLVED: To provide the structure wherein a high proof-pressure SiC vertical MOSFET having the channel region formed by a low concentration p-type deposited layer can be manufactured with the sufficient yield, and to provide a manufacturing method. SOLUTION: Between a low concentration p-type deposited film and a high concentration gate layer, a low concentration n-type deposited film is made to be interposed. Further, the base region led back to n-type by ion implantation is selectively formed in a low concentration p-type deposited film, so that the thickness of a deposited film between the high concentration gate layer and the channel region and gate oxide film is enlarged. COPYRIGHT: (C)2006,JPO&NCIPI
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申请公布号 |
JP2006147789(A) |
申请公布日期 |
2006.06.08 |
申请号 |
JP20040334920 |
申请日期 |
2004.11.18 |
申请人 |
NATIONAL INSTITUTE OF ADVANCED INDUSTRIAL & TECHNOLOGY |
发明人 |
YAO TSUTOMU;HARADA SHINSUKE;OKAMOTO MITSUHISA;FUKUDA KENJI |
分类号 |
H01L29/78;H01L21/336;H01L29/06;H01L29/12 |
主分类号 |
H01L29/78 |
代理机构 |
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