发明名称
摘要 Disclosed herein is a composition and method for semiconductor processing. In one embodiment, a wet-cleaning composition for removal of photoresist is provided. The composition comprises a strong base; an oxidant; and a polar solvent. In another embodiment, a method for removing photoresist is provided. The method comprises the steps of applying a wet-cleaning composition comprising about 0.1 to about 30 weight percent strong base; about one to about 30 weight percent oxidant; about 20 to about 95 weight percent polar solvent; and removing the photoresist.
申请公布号 JP2006515933(A) 申请公布日期 2006.06.08
申请号 JP20050510014 申请日期 2003.12.17
申请人 发明人
分类号 G03F7/42;B08B3/08;C11D7/06;C11D7/32;C11D7/50;C11D11/00;H01L21/027;H01L21/304;H01L21/306;H01L21/311;H01L21/3205 主分类号 G03F7/42
代理机构 代理人
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