| 摘要 |
PROBLEM TO BE SOLVED: To disclose a method for determining the position of fluorescent markers in a sample 4 with a high spatial resolution. SOLUTION: To this end, the sample 4 is illuminated with an exciting light beam 11, while the sample 4 is simultaneously scanned by a particle beam 3. During scanning, markers will be impinged upon by the particle beam 3 and will be damaged, in such a manner that the marker impinged upon will no longer emit fluorescence radiation. This leads to a reduction of the flux of fluorescence radiation. This reduction is detected. Seeing as the position of the particle beam 3 the sample is known at the moment that the marker is damaged, the position of the marker in the sample is, accordingly, also known. COPYRIGHT: (C)2006,JPO&NCIPI
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