发明名称 METHOD OF FORMING A THROUGH-SUBSTRATE INTERCONNECT
摘要 <p>A method of manufacturing a microelectronics device is provided, wherein the microelectronics device is formed on a substrate (20) having a frontside (24) and a backside (28). The method comprises forming a circuit element on the frontside (24) of the substrate (20) from a plurality of layers deposited on the frontside of the substrate (20), wherein the plurality of layers includes an intermediate electrical contact layer (34), and forming an interconnect structure (50) after forming the electrical contact layer (34). The interconnect structure (50) includes a contact pad (54) formed on the backside (28) of the substrate (20), and a through-substrate interconnect (52) in electrical communication with the contact pad (54), wherein the through-substrate interconnect (52) extends from the backside (28) of the substrate (20) to the electrical contact layer (34).</p>
申请公布号 EP1665369(A1) 申请公布日期 2006.06.07
申请号 EP20030759378 申请日期 2003.09.17
申请人 HEWLETT-PACKARD DEVELOPMENT COMPANY, L.P. 发明人 LAI, DIANE, W.;BERHANE, SAMSON;SNYDER, BARRY, C.;HELLEKSON, RONALD, A.;VANDER PLAS, HUBERT, A.
分类号 B41J2/16;H01L21/768;H01L23/48;(IPC1-7):H01L21/768 主分类号 B41J2/16
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