发明名称 |
Method and apparatus for high frequency data transmission and testability in a low voltage, differential swing design |
摘要 |
A high frequency data transmission circuit including design for testability (DFT) features. An integrated circuit includes core control logic to provide a data signal and output drive logic including a local data latch and a transmitter. The data latch receives the data signal and provides true and complementary forms of the data signal to the transmitter over symmetrical signal paths. The transmitter provides an output signal to an external receiver.
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申请公布号 |
US7057672(B2) |
申请公布日期 |
2006.06.06 |
申请号 |
US20010823078 |
申请日期 |
2001.03.29 |
申请人 |
INTEL CORPORATION |
发明人 |
SANDHU BAL S.;TIAN YANMEI;LIN CHIH-CHANG |
分类号 |
H04N5/38;G09G5/00;G09G5/36;H03F3/45 |
主分类号 |
H04N5/38 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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