发明名称 |
Method and system for an on-chip AC self-test controller |
摘要 |
A method for performing AC self-test on an integrated circuit, including a system clock for use during normal operation. The method includes applying a long data capture pulse to a first test register in response to the system clock, and further applying at an speed data launch pulse to the first test register in response to the system clock. Inputting the data from the first register to a logic path in response to applying the at speed data launch pulse to the first test register. Applying at speed data capture pulse to a second test register in response to the system clock. Inputting the output from the logic path to the second test register in response to applying the at speed data capture pulse to the second register. Applying a long data launch pulse to the second test register in response to the system clock.
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申请公布号 |
US7058866(B2) |
申请公布日期 |
2006.06.06 |
申请号 |
US20020131554 |
申请日期 |
2002.04.24 |
申请人 |
INTERNATIONAL BUSINESS MACHINES CORPORATION |
发明人 |
FLANAGAN JOHN D.;HERRING JAY R.;LO TIN-CHEE |
分类号 |
G01R31/28;G01R31/317;G01R31/319 |
主分类号 |
G01R31/28 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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