| 发明名称 |
Scanning IR microscope |
| 摘要 |
An FT-IR microscope is operated in association with a scanning spectrometer in such a way that incremental movement of the movable stage of the microscope is synchronized with the scans of the scanning spectrometer. This minimizes delays in processing time.
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| 申请公布号 |
US7057733(B2) |
申请公布日期 |
2006.06.06 |
| 申请号 |
US20040779959 |
申请日期 |
2004.02.17 |
| 申请人 |
SINGAPORE PTE. LTD. |
发明人 |
CARTER RALPH LANCE;HOULT ROBERT ALAN |
| 分类号 |
G01B9/02;G01J3/45;G01J3/06;G01J3/28;G01J3/453;G02B21/26 |
主分类号 |
G01B9/02 |
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