发明名称 Memory wordline spacer
摘要 A memory includes a semiconductor substrate and a charge-trapping dielectric layer. First and second bitlines are implanted and a wordline layer is deposited and formed. A doped wordline spacer layer is deposited and a doped wordline spacer is formed adjacent to the wordline.
申请公布号 US7053446(B1) 申请公布日期 2006.05.30
申请号 US20040864142 申请日期 2004.06.08
申请人 ADVANCED MICRO DEVICES, INC. 发明人 SAHOTA KASHMIR S.;KAMAL TAZRIEN;RAMSBEY MARK T.
分类号 H01L29/792;H01L21/336;H01L21/8234;H01L21/8246;H01L27/115 主分类号 H01L29/792
代理机构 代理人
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