| 摘要 |
A system and method for detecting a defect in a transistor array includes applying a test signal to the array, monitoring pixel voltages along a gate line of the array, and detecting a defect associated with the gate line based on a variation in the pixel voltages along the gate line during the monitoring step. The system and method can also detect a precise location of the defect based on a rate of change in the variation of the pixel voltages along the gate line.
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