A CdTe compound semiconductor single crystal useful for a substrate for optical devices such as an infrared sensor is provided by specifying a resistivity and a contained quantity of impurities of the CdTe compound semiconductor single crystal. The CdTe compound semiconductor single crystal for optical devices contains a first group (1A) element of 5×10<SUP>14</SUP>-6×10<SUP>15</SUP>cm<SUP>-3</SUP> in the crystal. A total quantity of a 13th (3B) group element and a 17th (7B) group element contained in the crystal is less than 2×10<SUP>15</SUP>cm<SUP>-3</SUP> and is less than the total quantity of the first (1A) group element, and the resistivity is permitted to be 10-10<SUP>4</SUP>?cm.