发明名称 MINUTE PATTERN CORRECTION METHOD
摘要 PROBLEM TO BE SOLVED: To provide a minute pattern correction method capable of preventing generation of minute cracks. SOLUTION: A correction paste 21 is coated on a rib chip defect 85 generated to a rib 83 formed on a surface of a glass substrate 80, and laser spot 31 is moved along the longitudinal direction of a correction portion 30 made of the coated correction paste 21, and the correction portion 30 is calcined. Thereby, in the correction portion 30, the stresses generated in the portion irradiated with laser beam is released to the portion which is not irradiated by laser beam, and a large stress will not be generated. COPYRIGHT: (C)2006,JPO&NCIPI
申请公布号 JP2006134787(A) 申请公布日期 2006.05.25
申请号 JP20040324578 申请日期 2004.11.09
申请人 NTN CORP 发明人 YAMAZAKI SHIZUKA;YADA YUJI
分类号 H01J9/02;H01J11/02;H01J11/22;H01J11/34;H01J11/36 主分类号 H01J9/02
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