发明名称 |
SEMICONDUCTOR DEVICE, METHOD AND APPARATUS FOR TESTING SAME, AND METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICE |
摘要 |
A semiconductor device wherein an electrode pad to be contacted a test probe for performing probe testing, a bonding area mark for defining a bonding area which performs wire boding on the electrode pad, and a probe area mark for defining a probe repair area for repairing or replacing the test probe for the electrode pad. |
申请公布号 |
KR20060050691(A) |
申请公布日期 |
2006.05.19 |
申请号 |
KR20050078679 |
申请日期 |
2005.08.26 |
申请人 |
NEC ELECTRONICS CORPORATION |
发明人 |
JIMI JUNICHI |
分类号 |
H01L21/66 |
主分类号 |
H01L21/66 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|