| 摘要 |
A reliability test method for a ferroelectric memory device having a ferroelectric capacitor evaluates, under acceleration conditions (acceleration temperature T<SUB>2 </SUB>and test time t<SUB>2</SUB>), whether or not life of retention characteristics of the ferroelectric memory device is guaranteed under actual use conditions (guarantee temperature T<SUB>1 </SUB>and guarantee time t<SUB>1</SUB>). The method includes the step of determining test time t<SUB>2 </SUB>that is required to evaluate whether the life of the retention characteristics is guaranteed or not, based on temperature dependence of change with time of a bit line voltage that is generated when data written to the ferroelectric memory device is read.
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