发明名称 |
Accelerated low power fatigue testing of fram |
摘要 |
Systems and methods fatigue a ferroelectric memory device. Within a single cycle, a group of selected ferroelectric memory cells is fatigued by reading a first logical value from the cells while also writing a second logical value to the memory cells. The first logical value is temporarily stored into latches of sense amplifiers associated with the selected memory cells in order to decipher logical values. Subsequently, the first logical value is written back to the ferroelectric memory cells and a cycle of the fatigue operation is ended.
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申请公布号 |
US2006107095(A1) |
申请公布日期 |
2006.05.18 |
申请号 |
US20050260987 |
申请日期 |
2005.10.28 |
申请人 |
TEXAS INSTRUMENTS INCORPORATED |
发明人 |
FONG JOHN Y.;SESHADRI ANAND;LIN SUNG-WEI;MADAN SUDHIR K.;ELIASON JARROD |
分类号 |
G06F11/00 |
主分类号 |
G06F11/00 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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