发明名称 |
Operating parameters e.g. operating temperatures, reading and selecting method for e.g. dynamic RAM, involves providing memory with registers to store parameters, where read and write access on register takes place similar to access on cell |
摘要 |
<p>The method involves providing an integrated semiconductor memory (100) with mode-register and extended- mode-register for storing operating parameters. Reading and selecting of the parameters from one of the registers take place in an address interface, based on the state of configuration signals. Read and write access on one of the registers takes place similar to read and write access on a memory cell of memory cell fields (10). An independent claim is also included for an integrated semiconductor memory.</p> |
申请公布号 |
DE102004053316(A1) |
申请公布日期 |
2006.05.18 |
申请号 |
DE20041053316 |
申请日期 |
2004.11.04 |
申请人 |
INFINEON TECHNOLOGIES AG |
发明人 |
PERNER, MARTIN;BUCKSCH, THORSTEN |
分类号 |
G11C11/4063 |
主分类号 |
G11C11/4063 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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