| 摘要 |
<P>PROBLEM TO BE SOLVED: To achieve an IC tester capable of testing speedily, even for a low-speed test head. <P>SOLUTION: The IC tester for testing a target to be tested by the test head is improved and has a parallel/serial conversion section for inputting a plurality of outputs in the test head, for outputting to the target to be tested as a serial signal. <P>COPYRIGHT: (C)2006,JPO&NCIPI |
