发明名称 |
Method and apparatus for a wobble fixture probe for probing test access point structures |
摘要 |
A method and apparatus for a wiping fixture probe for cleaning oxides, residues or other contaminants from the surface of a solder bead probe and probing a solder bead probe on a printed circuit board during in-circuit testing.
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申请公布号 |
US2006103405(A1) |
申请公布日期 |
2006.05.18 |
申请号 |
US20040978100 |
申请日期 |
2004.10.29 |
申请人 |
PARKER KENNETH P;RIVAS RICHARD W SR |
发明人 |
PARKER KENNETH P.;RIVAS RICHARD W.SR. |
分类号 |
G01R31/02 |
主分类号 |
G01R31/02 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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