发明名称 Semiconductor device and method for manufacturing the same
摘要 A silicon film is crystallized in a predetermined direction by selectively adding a metal element having a catalytic action for crystallizing an amorphous silicon and annealing. In manufacturing TFT using the crystallized silicon film, TFT provided such that the crystallization direction is roughly parallel to a current-flow between a source and a drain, and TFT provided such that the crystallization direction is roughly vertical to a current-flow between a source and a drain are manufactured. Therefore, TFT capable of conducting a high speed operation and TFT having a low leak current are formed on the same substrate.
申请公布号 US7045819(B2) 申请公布日期 2006.05.16
申请号 US20020273999 申请日期 2002.10.21
申请人 SEMICONDUCTOR ENERGY LABORATORY CO., LTD. 发明人 TAKEMURA YASUHIRO
分类号 G02F1/136;H01L29/04;G02F1/1368;H01L21/20;H01L21/265;H01L21/336;H01L21/77;H01L21/84;H01L27/12;H01L29/78;H01L29/786 主分类号 G02F1/136
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