发明名称 |
Buffer for testing a memory module and method thereof |
摘要 |
In a method, a test pattern and an associated input mode may be received where the input mode may indicate a manner of applying the test pattern. An output test pattern is applied to at least one of a plurality of memory interface pins in accordance with the input mode. In a buffer, a test register may be configured to receive and store a test pattern and an associated input mode where the input mode may indicate a manner of applying the test pattern. The buffer may further include a test pattern generator configured to repeatedly generate an output test pattern based on the associated input mode.
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申请公布号 |
US2006095817(A1) |
申请公布日期 |
2006.05.04 |
申请号 |
US20050260318 |
申请日期 |
2005.10.28 |
申请人 |
LEE KEE-HOON;SHIN SEUNG-MAN |
发明人 |
LEE KEE-HOON;SHIN SEUNG-MAN |
分类号 |
G11C29/00 |
主分类号 |
G11C29/00 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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