| 摘要 |
<p>The present invention relates to a device and system from doing mechanical and electrical measurements and manipulation on nano or micro sized objects (206) using a sample holder adapted to fit in situ of a transmission electron microscope. The sample 5 holder comprise at least two arms (203, 204) each with at least one connector (201 , 202) whereby the sample (206) may be mounted between the two connectors (201 , 202) forming a bridge closing a gap (205) between the two arms (203, 204) of the sample holder (200). The sample holder (200) is arranged to provide mechanical forces to a sample (206) mounted on the sample holder and measuring and/or applying electrical 0 signals from the sample (206) while at the same imaging using the transmission electron microscope. Each arm of the sample holder may comprise three substantially parallel beams for electro-thermal actuation.</p> |
