发明名称 Method for making a semiconductor device with a high-k gate dielectric layer and a silicide gate electrode
摘要 A method for making a semiconductor device is described. That method comprises forming a high-k gate dielectric layer on a substrate, forming a barrier layer on the high-k gate dielectric layer, and forming a fully silicided gate electrode on the barrier layer.
申请公布号 US2006094180(A1) 申请公布日期 2006.05.04
申请号 US20040980522 申请日期 2004.11.02
申请人 INTEL CORPORATION 发明人 DOCZY MARK L.;BRASK JUSTIN K.;KAVALIEROS JACK;METZ MATTHEW V.;DATTA SUMAN;CHAU ROBERT S.
分类号 H01L21/8238 主分类号 H01L21/8238
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