发明名称 |
Tester system having multiple instruction memories |
摘要 |
An apparatus for testing an integrated circuit includes a sequence control logic unit having an output channel connectable to an input pin of a device under test, a first memory to store a first instruction set comprising instructions executable by the sequence control logic unit, and a second memory to store a second instruction set comprising instructions executable by the sequence control logic unit, wherein at least one of the first memory and the second memory comprises a memory accessible in a non-sequential fashion.
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申请公布号 |
US7039841(B2) |
申请公布日期 |
2006.05.02 |
申请号 |
US20030435613 |
申请日期 |
2003.05.08 |
申请人 |
CREDENCE SYSTEMS CORPORATION |
发明人 |
CULLEN JAMIE S.;SAKAITANI KRIS |
分类号 |
G01R31/28;G01R31/3183;G01R31/26;G01R31/317;G01R31/319 |
主分类号 |
G01R31/28 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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