发明名称 |
NONVOLATILE MEMORY CELL WITH TRENCH HAVING FIRST PART DEEPER THAN SECOND PART, ARRAY OF MEMORY CELL AND MANUFACTURING METHOD THEREOF |
摘要 |
PROBLEM TO BE SOLVED: To provide a nonvolatile floating gate memory cell made by a trench of a semiconductor substrate. SOLUTION: A nonvolatile memory cell is made in a substrate of a substantially single crystalline semiconductive material having a first conductive type and a surface. The trench resides on the surface, and extends over a first depth and a second depth deeper than the first depth in the substrate. The trench is provided with: a first side wall along the trench extending to the first depth; a second side wall along the trench extending from the first depth to the second depth; and a bottom wall along a bottom face of the trench. A first region of a second conductive type resides in a substrate along the bottom face of the trench. A second region of the second conductive type resides in a substrate along the front surface of the trench. COPYRIGHT: (C)2006,JPO&NCIPI
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申请公布号 |
JP2006114922(A) |
申请公布日期 |
2006.04.27 |
申请号 |
JP20050325328 |
申请日期 |
2005.10.12 |
申请人 |
SILICON STORAGE TECHNOLOGY INC |
发明人 |
KIANIAN SOHRAB;LEVI AMITAY |
分类号 |
H01L21/8247;H01L27/115;H01L29/788;H01L29/792 |
主分类号 |
H01L21/8247 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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