发明名称 NONVOLATILE MEMORY CELL WITH TRENCH HAVING FIRST PART DEEPER THAN SECOND PART, ARRAY OF MEMORY CELL AND MANUFACTURING METHOD THEREOF
摘要 PROBLEM TO BE SOLVED: To provide a nonvolatile floating gate memory cell made by a trench of a semiconductor substrate. SOLUTION: A nonvolatile memory cell is made in a substrate of a substantially single crystalline semiconductive material having a first conductive type and a surface. The trench resides on the surface, and extends over a first depth and a second depth deeper than the first depth in the substrate. The trench is provided with: a first side wall along the trench extending to the first depth; a second side wall along the trench extending from the first depth to the second depth; and a bottom wall along a bottom face of the trench. A first region of a second conductive type resides in a substrate along the bottom face of the trench. A second region of the second conductive type resides in a substrate along the front surface of the trench. COPYRIGHT: (C)2006,JPO&NCIPI
申请公布号 JP2006114922(A) 申请公布日期 2006.04.27
申请号 JP20050325328 申请日期 2005.10.12
申请人 SILICON STORAGE TECHNOLOGY INC 发明人 KIANIAN SOHRAB;LEVI AMITAY
分类号 H01L21/8247;H01L27/115;H01L29/788;H01L29/792 主分类号 H01L21/8247
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