| 摘要 |
PROBLEM TO BE SOLVED: To provide an anisotropic conductive connector in which conduction inspection of a semiconductor element or the like can be carried out with a comparatively low contact load, and durability is improved. SOLUTION: This is a structure in which a plurality of conduction passages 2 composed of a conductive material are formed mutually insulated in a film substrate 1 made of an insulating polymer, and the respective axis is in inclined state with an acute angle to the perpendicular of the main surface of the film substrate and penetrates the film substrate 1 in thickness direction, and its end face is exposed. The plurality of conduction passages 2 are constructed of a first conduction passage 2A inclined in a first direction and a second conduction passage 2B inclined in a second direction 180°opposite to the first direction. COPYRIGHT: (C)2006,JPO&NCIPI
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