| 摘要 |
PROBLEM TO BE SOLVED: To provide a measurement system or the like for obtaining a high-precision three-dimensional shape, in which a movement parameter is easily and precisely obtained even in a measurement object of a large body or a complicated shape. SOLUTION: The three-dimensional shape measurement system or the like is provided with: a lattice pattern projection means 101 for projecting a sinusoidal wave lattice pattern on the measurement object 163; a lattice driving means for moving the lattice pattern projection means in a prescribed direction by a prescribed amount; an image taking means 100 having a coordinate system consisting of a peculiar origin and coordinate axes, for taking an image of the measurement object on which the sinusoidal wave lattice pattern is projected; a movement means for moving the image taking means; an auxiliary second lattice pattern projection means 162 for projecting the sinusoidal wave lattice pattern on the measurement object; a second lattice driving means for moving the second lattice pattern projection means in the prescribed direction by the prescribed amount; and a unified calibration means for making the coordinate system of the image taking means be consistent before and after the movement. COPYRIGHT: (C)2006,JPO&NCIPI
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