发明名称 |
Transistor with a strained region and method of manufacture |
摘要 |
A transistor structure comprises a channel region overlying a substrate region. The substrate region comprises a first semiconductor material with a first lattice constant. The channel region comprises a second semiconductor material with a second lattice constant. The source and drain regions are oppositely adjacent the channel region and the top portion of the source and drain regions comprise the first semiconductor material. A gate dielectric layer overlies the channel region and a gate electrode overlies the gate dielectric layer.
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申请公布号 |
US2006081875(A1) |
申请公布日期 |
2006.04.20 |
申请号 |
US20040967917 |
申请日期 |
2004.10.18 |
申请人 |
LIN CHUN-CHIEH;LEE WEN-CHIN;YEO YEE-CHIA;HU CHENMING |
发明人 |
LIN CHUN-CHIEH;LEE WEN-CHIN;YEO YEE-CHIA;HU CHENMING |
分类号 |
H01L31/109;H01L29/76;H01L31/0328 |
主分类号 |
H01L31/109 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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