发明名称 Transistor with a strained region and method of manufacture
摘要 A transistor structure comprises a channel region overlying a substrate region. The substrate region comprises a first semiconductor material with a first lattice constant. The channel region comprises a second semiconductor material with a second lattice constant. The source and drain regions are oppositely adjacent the channel region and the top portion of the source and drain regions comprise the first semiconductor material. A gate dielectric layer overlies the channel region and a gate electrode overlies the gate dielectric layer.
申请公布号 US2006081875(A1) 申请公布日期 2006.04.20
申请号 US20040967917 申请日期 2004.10.18
申请人 LIN CHUN-CHIEH;LEE WEN-CHIN;YEO YEE-CHIA;HU CHENMING 发明人 LIN CHUN-CHIEH;LEE WEN-CHIN;YEO YEE-CHIA;HU CHENMING
分类号 H01L31/109;H01L29/76;H01L31/0328 主分类号 H01L31/109
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