发明名称 Non-contact apparatus and method for measuring surface profile
摘要 Embodiments of the invention provide a non-contact method for measuring the surface profile of an object that can include generating a point-type optical signal and projecting it on a rotatable precision optical grating, generating a rotating pattern of light and dark lines onto the object, recording a series of images of the rotating pattern moving across the object with an image receiving device and calculating the surface profile of the object. Other embodiments can include a method to calibrate the system and a non-contact apparatus that generally includes a point-type light source, a rotatably mounted optical grating being configured to project a moving grating image on the object, a processor in communication with the image capturing device and configured to receive image input from the image capturing device and generate a surface profile representation of the object therefrom.
申请公布号 US2006082787(A1) 申请公布日期 2006.04.20
申请号 US20050205063 申请日期 2005.08.17
申请人 SOUTHWEST RESEARCH INSTITUTE 发明人 FRANKE ERNEST A.;MAGEE MICHAEL J.;RIGNEY MICHAEL P.;MITCHELL JOSEPH N.;BEESON ROBERT J.
分类号 G01B11/30;G01B11/25 主分类号 G01B11/30
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