Semi-conductor component, as well as a process for the reading of test data

摘要

The invention relates to a semi-conductor component ( 2 a, 2 b), and a process for reading test data, whereby the process comprises the steps: (a) Reading test data generated during a semi-conductor component test procedure from at least one test data register ( 102 a) of a semi-conductor component ( 2 a), (b) Storing the test data in at least one useful data memory cell on the semi-conductor component ( 2 a), and (c) Reading the test data from the at least one useful data memory cell.