| 摘要 |
PROBLEM TO BE SOLVED: To provide an imaging apparatus for detecting a linear defect of bright and dark lines and correcting a pixel signal of the detected linear defect when the operating temperature of a solid-state image sensor is high, and to provide a correction method of the pixel signal. SOLUTION: The solid-state image sensor 3 is operated in a light shield state, a linear defect detection correction circuit 6 detects the linear defect of the solid-state image sensor 3 on the basis of the pixel signal of the solid-state imaging element 3, and an address of the detected linear defect is stored. In the case of operating the imaging apparatus, the linear defect detection correction circuit 6 detects the operating temperature of the solid-state image sensor 3, compares the detected temperature with a threshold value, and when it is discriminated that the operating temperature of the solid-state image sensor 3 is higher than the threshold value, the address wherein the stored linear defect is read out, and the pixel signal of the linear defect corresponding to the address of the solid-state image sensor 3 is corrected. COPYRIGHT: (C)2006,JPO&NCIPI
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