| 摘要 |
PROBLEM TO BE SOLVED: To provide an imaging apparatus for detecting a linear defect extended in a vertical direction produced due to a potential dip of a horizontal transfer register and correcting a pixel signal of the detected linear defect when an operating temperature of a solid-state image sensor is low, and to provide a correction method of the pixel signal. SOLUTION: The solid-state image sensor 3 is activated at a low temperature, a linear defect detection correction circuit 6 detects the linear defect of the solid-state image sensor 3 on the basis of the pixel signal of the solid-state image sensor 3, and an address of the detected linear defect is stored. In the case of operating the imaging apparatus, the linear defect detection correction circuit 6 detects the operating temperature of the solid-state image sensor 3, compares the detected temperature with a threshold value, when it is discriminated that the operating temperature of the solid-state image sensor 3 is lower than the threshold value, the address wherein the stored linear defect is read out, and the pixel signal of the linear defect corresponding to the address of the solid-state image sensor 3 is corrected. COPYRIGHT: (C)2006,JPO&NCIPI
|
