Test system for device characterization

摘要

Device characterization performed with a test system including a fixture and multiple frequency dependent test boards. In one embodiment, testing is performed with multiple sets of input and output test boards wherein each set is frequency dependent at different frequencies. In some examples, the test board includes an impedance transformer that is a quarter wave length of the fundamental frequency (f₀) of a frequency of which the board is dependent. In some examples, S-parameters and load pull measurements are obtained for the device under test with the test boards at different frequencies.