| 摘要 |
PROBLEM TO BE SOLVED: To provide an electronic circuit testing device suitable for testing an electronic circuit for conducting inter-substrate communication by inductive coupling, and capable of testing the electronic circuit without using a pad for a test. SOLUTION: A probe 15 is interposed in a communication channel constituted of the inductive coupling by the first and second transmission coils 21a, 21b and the first and second reception coils 23a, 23b to test an LSI by a tester 11, buffers 12, 13, and a Tx/Rx switch 14. Needles contacting with a pad of the electronic circuit and a lead thereof are not thereby required to be provided in the electronic circuit testing device, and a service life is prolonged thereby. COPYRIGHT: (C)2006,JPO&NCIPI
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