发明名称 RADIOGRAPHIC INSPECTION SYSTEM
摘要 A radiographic inspection system for inspecting subject objects using charged particle beams having pulses of charged particles with different energy levels from pulse to pulse. A phase shifter (134) thereof enables adjustment of the RF power (106) delivered to first and second accelerating sections (102, 104) thereof from a single RF source without adjustment of the RF power generated by the RF source (130). The system also enables the generation of images of the contents of a container from multiple directions and in multiple planes, and allows the discrimination of materials present in the container.
申请公布号 WO2005022554(A3) 申请公布日期 2006.04.13
申请号 WO2004US28030 申请日期 2004.08.27
申请人 SCANTECH HOLDINGS, LLC;ZAVADTSEV, ALEXANDRE, A.;BOWSER, GARY, F. 发明人 ZAVADTSEV, ALEXANDRE, A.;BOWSER, GARY, F.
分类号 (IPC1-7):H01J40/14 主分类号 (IPC1-7):H01J40/14
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