发明名称 |
A METHOD FOR SUPERCRITICAL CARBON DIOXIDE PROCESSING OF FLUORO-CARBON FILMS |
摘要 |
<p>A method for treating a fluoro-carbon dielectric film (4, 26) for integration of the dielectric film (4, 26) into a semiconductor device. The method includes providing a substrate (2, 22, 105) having a fluoro-carbon film (4, 26) deposited thereon, the film (4, 26) having an exposed surface (6) containing contaminants (8), and treating the exposed surface (6) with a supercritical carbon dioxide fluid to clean the exposed surface (6) of the contaminants (8) and provide surface termination. The supercritical carbon dioxide treatment improves adhesion and electrical properties of film structures (1, 20) containing a metal-containing film (12, 30) formed on the surface of the fluoro-carbon dielectric film (4, 26).</p> |
申请公布号 |
WO2006039026(A1) |
申请公布日期 |
2006.04.13 |
申请号 |
WO2005US30663 |
申请日期 |
2005.08.30 |
申请人 |
TOKYO ELECTRON LIMITED;TOKYO ELECTRON AMERICA, INC.;KAWAMURA, KOHEI;ASANO, AKIRA;MIYATANI, KOUTAROU;HILLMAN, JOSEPH, T.;PALMER, BENTLEY |
发明人 |
KAWAMURA, KOHEI;ASANO, AKIRA;MIYATANI, KOUTAROU;HILLMAN, JOSEPH, T.;PALMER, BENTLEY |
分类号 |
H01L21/3105;H01L21/312;H01L21/3205;H01L21/768 |
主分类号 |
H01L21/3105 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|