发明名称 STRUCTURE MONITOR SYSTEM
摘要 A structure monitor system comprising a measuring unit 3 for measuring distortions of the structure S at respective points on a boundary by using an optical fiber sensor 2 laid on the boundary of the structure, numerical analysis unit 5 for calculating a distortion at a specified point on the structure S by a numerical analysis method with distortions measured by the measuring unit as a boundary condition, and a display unit 6 for displaying information on an analysis distortion by the numerical analysis unit 5 in a association with a position on the structure S.
申请公布号 EP1645851(A1) 申请公布日期 2006.04.12
申请号 EP20030741148 申请日期 2003.07.02
申请人 NEUBREX CO., LTD. 发明人 KISHIDA, KINZO,;NAKANO, MOTOHIRO;YAMAUCHI, YOSHIAKI
分类号 G01D5/26;E21F17/18;G01B11/16;G01D5/353;G01K7/42;G01K11/32;G01M11/08 主分类号 G01D5/26
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